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Gratings Inc is committed to provide customers our best-effort products, some of which are lised below:

1. Surface photovoltage based minority carrier diffusion length measurement system based on labVIEW software.

SPECTRAL SURFACE PHOTOVOLTAGE SYSTEM

 

 

SYSTEM FEATURES:

♦ Simultaneous measurement of surface passivation and minority carrier lifetime.

♦ Capability to measure up to 6x6 inch silicon wafers.

♦ Customized electronic circuit board hardware.

♦ Capability to measure solar cells.

♦ Ito-coated quartz plate.

♦ Au-coated vacuum chuck for holding wafers.

♦ SR 510 lock-in amplifier for sensitive detector in low V range.

♦ User-friendly LabVIEW interface.

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2. Optical absorption in 400-1600-nm range based on labVIEW software.

SPECTRAL OPTICAL ABSORPTION SYSTEM

 

 

SYSTEM FEATURES:

♦ Transmission measurements over a broad spectral range.

♦ Capability to measure conventional wafers and thin films.

♦ Calibration with narrow band filters.

♦ Measurements of GaAs, Si, and Ge wafers.

♦ Capability to measure entire wafers.

♦ 500-1600-nm range with 1-nm resolution.

♦ SR 510 lock-in amplifier for sensitive detector in low Voltage range.

♦ LabVIEW interface.

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3. Solar cell current-voltage measurement systems based on labVIEW software.

FLASH LIV TESTER

 

 

SYSTEM FEATURES:

♦ Precise current measurement as a function of voltage.

♦ Capability to measure up to 6x6 inch area solar cells.

♦ Customized NI-based data acquisition hardware.

♦ User-friendly PC-based LabVIEW interface.

♦ Pulsed Xenon light source.

♦ AM 1.5 light incidence.

♦ Intensity variation in ~ 10 – 100 mW/cm2 range.

♦ Independently measured solar cells for system calibration.

 

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4. solar panel LIV system with pulsed xenon lamps using labVIEW software.

PULSED SOLAR PANEL I-V SYSTEM

 

 

SYSTEM FEATURES:

♦ Pulsed, Xenon light source.

♦ Capability to measure up to 10-200 WP solar panels.

♦ Customized electronic circuit board hardware.

♦ Capability to measure c-Si, a-Si, and other thin-film panels.

♦ Precisely controlled load resistors.

♦ Shift resistor approach.

♦ NI USB-6008 & 6009.

♦ LabVIEW interface.

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5. table-top RTA system for 5"x5" wafers in tube and parallel-plate configurations.

TABLE-TOP RTA SYSTEM

 

 

SYSTEM FEATURES:

♦ Table-top RTA furnaces.

♦ Capability to heat single and multiple 5” wafers.

♦ Round and parallel plate configurations.

♦ Temperature range ~ 900 °C.

♦ Precisely controlled temperatures.

♦ Top & bottom quartz-halogen lamps.

♦ 4-6 kW thermal power.

♦ Type k thermocouples.

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6. XeF2 vapor etching system 6"x6" wafers using labVIEW software.

XeF2 VAPOR ETCH SYSTEM

 

 

SYSTEM FEATURES:

♦ Less than 5 % Standard Deviation.

♦ 2XeF2+Si=2Xe+SiF4.

♦ High Selectivity for Most Etch Masks.

♦ Dry Process, No Surface Damage.

♦ LabVIEW control.

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